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陷阱效应对4H-SiC MESFET频率特性的影响
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The Influence of Trapping Effect on Frequency Characteristics in 4H-SiC MESFETs L Hong-liang1,ZHANG Yi-men1,ZHANG Yu-ming1,CHE Yong2,WANG Yue-hu 1,SHAO Ke1
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文章历史
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收稿日期 |
修回日期 |
出版日期 |
2007-05-08 |
2007-11-05 |
2008-05-25 |
发布日期 |
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2008-05-25 |
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