EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks
LIU Yu1, HAN Feng1, LU Xi-cheng1, WANG Jian-guo1,2
1. Department of No. 5, Northwest Institute of Nuclear Technology, Xi'an, Shaanxi 710024, China;
2. School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China
A modeling method based on hierarchical Bayesian networks (HBN) which can be used in the susceptibility assessment of electronic system interfered by electromagnetic pulse (EMP) is proposed.According to the hierarchical structure of the electronic system and the feature of its EMP effects,steps to assess the system susceptibility are discussed.Analyzing the couple path by using the interaction sequence diagram (ISD),and the proper volume nodes of the base level of the ISD and the probability distribution of the electromagnetic stress in these nodes are determined.The topology relationship between the HBN and ISD is created by adding the directed arc from the base proper volume nodes of the ISD to the root nodes of HBN.The base proper volume level is considered as new root level to rebuild the HBN of system which can be used as the susceptibility assessment model of electronic system interfered by EMP.A case study demonstrates the effectiveness of the proposed methodology.
刘钰, 韩峰, 陆希成, 王建国. 电子系统电磁脉冲易损性评估的分层贝叶斯网络模型[J]. 电子学报, 2016, 44(11): 2695-2703.
LIU Yu, HAN Feng, LU Xi-cheng, WANG Jian-guo. EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks. Acta Electronica Sinica, 2016, 44(11): 2695-2703.
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2016, Vol. 44 
