@article{史淑廷_2546, author = {[史淑廷, 郭刚, 刘建成, 蔡莉, 陈泉, 沈东军, 惠宁, 张艳文, 覃英参, 韩金华, 陈启明, 张付强, 殷倩, 肖舒颜]}, title = {半导体器件内离子有效LET值测量方法研究}, publisher = {电子学报}, year = {2018}, journal = {电子学报}, volume = {46}, number = {10}, eid = {2546}, pages = {2546-2550}, keywords = {单粒子效应;电荷收集;有效LET值;SRAM}, doi = https://www.ejournal.org.cn/CN/10.3969/j.issn.0372-2112.2018.10.032 }