@article{何宝平_1229, author = {[何宝平, 王桂珍, 周辉, 罗尹虹, 姜景和]}, title = {NMOSFET器件不同源、不同γ剂量率辐射损伤比较}, publisher = {电子学报}, year = {2002}, journal = {电子学报}, volume = {30}, number = {8}, eid = {1229}, pages = {1229-1231}, keywords = {γ射线;电子;质子;剂量率;辐射损伤}, url = https://www.ejournal.org.cn/CN/abstract/article_1736.shtml }