@article{于宗光_68, author = {[于宗光, 徐征, 叶守银, 张国华, 黄卫, 王万业, 许居衍]}, title = {FLOTOXEEPROM擦写过程中隧道氧化层陷阱俘获电荷的研究}, publisher = {电子学报}, year = {2000}, journal = {电子学报}, volume = {28}, number = {5}, eid = {68}, pages = {68-70}, keywords = {EEPROM;隧道氧化层;陷阱俘获电荷;耐久性;擦写;阈值电压;电场}, url = https://www.ejournal.org.cn/CN/abstract/article_4383.shtml }