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电子学报  2017, Vol. 26 Issue (5): 1096-1100    DOI: 10.1049/cje.2017.08.002
MICROWAVE AND ELECTRONIC SYSTEM ENGINEERING 最新目录| 下期目录| 过刊浏览| 高级检索 |
A Novel Through-the-Wall Imaging Algorithm Combined with Phase Shift Migration and NUFFT
ZHANG Peng1,2, FEI Peng1,2, WEN Xin1,2, NIAN Feng1,2
1. Institute of Radio Metrology and Measurement, Beijing 100854, China;
2. Science and Technology on Metrology and Calibration Laboratory, Beijing 100854, China
A Novel Through-the-Wall Imaging Algorithm Combined with Phase Shift Migration and NUFFT
ZHANG Peng1,2, FEI Peng1,2, WEN Xin1,2, NIAN Feng1,2
1. Institute of Radio Metrology and Measurement, Beijing 100854, China;
2. Science and Technology on Metrology and Calibration Laboratory, Beijing 100854, China

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