电子学报 ›› 2018, Vol. 46 ›› Issue (6): 1461-1467.DOI: 10.3969/j.issn.0372-2112.2018.06.027

• 学术论文 • 上一篇    下一篇

总线胚胎电子细胞阵列中空闲细胞数目优选

王涛, 蔡金燕, 孟亚峰, 孟繁卿, 朱赛   

  1. 陆军工程大学石家庄校区, 河北石家庄 050003
  • 收稿日期:2017-02-23 修回日期:2017-07-09 出版日期:2018-06-25 发布日期:2018-06-25
  • 作者简介:王涛,男,1992年生于四川南充.现为陆军工程大学石家庄校区博士研究生.主要研究方向为仿生电子系统设计及电子系统自修复设计.E-mail:wangtao920110@126.com;蔡金燕,女,1961年生于天津武清.现为陆军工程大学石家庄校区教授、博士生导师.主要研究方向为电子系统可靠性分析与设计,电子系统仿生自修复设计等.E-mail:cjyrad@163.com;孟亚峰,男,1970年生于河北石家庄.现为陆军工程大学石家庄校区副教授、硕士生导师.主要研究方向为电子系统可靠性分析与设计,电子系统仿生自修复设计等.E-mail:myfrad@163.com
  • 基金资助:
    国家自然科学基金(No.61372039,No.61271153,No.61601495)

Idle Cells Optimum Selection Method for Bus-Based Embryonic Electronic Cell Array

WANG Tao, CAI Jin-yan, MENG Ya-feng, MENG Fan-qing, ZHU Sai   

  1. Shijiazhuang Division of Army Engineering University, Shijiazhuang, Hebei 050003, China
  • Received:2017-02-23 Revised:2017-07-09 Online:2018-06-25 Published:2018-06-25

摘要: 胚胎仿生硬件技术为高可靠性大规模集成电路系统设计提供了一种新思路.在确定规模的总线胚胎电子细胞阵列中,为兼顾阵列的硬件资源消耗和可靠性,本文提出了一种阵列内空闲细胞数目的优选方法.基于多态系统可靠性理论,利用通用生成函数建立阵列的可靠性模型.以阵列MOS(Metal Oxide Semiconductor)管消耗数目为硬件资源消耗衡量指标,建立阵列的硬件资源消耗模型.基于阵列的可靠性和硬件资源消耗模型,在一定设计约束条件下,对阵列内空闲细胞数目进行优选.仿真实验和分析表明,该方法能够根据阵列设计要求选择最合适的阵列内空闲细胞数目,同时,解决了胚胎电子细胞阵列中空闲细胞数目选择依靠经验的问题.

关键词: 胚胎电子, 总线, 空闲细胞, 故障修复, 硬件资源消耗, 可靠性, 多态系统

Abstract: Embryonic bio-inspired hardware technology provides a new idea for designing large scale integrated circuit with high reliability.In the bus-based embryonic electronic cell array (BEECA) with determined scales,an idle cells optimum selection method is proposed,which finds a balance between hardware resource consumption and reliability.Based on the multi-state system reliability theory,a universal generating function (UGF) is used to establish BEECA reliability model.The consumed number of MOS (Metal Oxide Semiconductor) transistors is used to measure BEECA hardware resource consumption,and BEECA hardware resource consumption model is established.Based on the established reliability model and hardware resource consumption model,the unoccupied cell number in the array is selected under the constraints of the design.The simulation experiment and analysis indicate that the proposed design can optimize the selection,and in the meanwhile the selection can avoid the dependence on the experiences.

Key words: embryonic electronic, bus, idle cells, fault repair, hardware resource consumption, reliability, multi-state system

中图分类号: