@article{赵元富_2511, author = {[赵元富, 王亮, 岳素格, 孙永姝, 王丹, 刘琳, 刘家齐, 王汉宁]}, title = {纳米级CMOS集成电路的单粒子效应及其加固技术}, publisher = {电子学报}, year = {2018}, journal = {电子学报}, volume = {46}, number = {10}, eid = {2511}, pages = {2511-2518}, keywords = {集成电路;纳米级;单粒子效应;抗辐射加固}, doi = https://www.ejournal.org.cn/CN/10.3969/j.issn.0372-2112.2018.10.027 }