28nm CMOS工艺8-Gbps SerDes单粒子辐射特性研究
文溢, 陈建军, 梁斌, 池雅庆, 黄俊
Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology
WEN Yi, CHEN Jian-jun, LIANG Bin, CHI Ya-qing, HUANG Jun
电子学报
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2022, (11): 2653
-2658
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DOI: 10.12263/DZXB.20211691
