基于工艺参数扰动的IC参数成品率多目标优化算法
李鑫, 孙晋, 肖甫, 田江山
A Multi-objective Optimization Framework for Robust IC Parametric Yield Predication Under Process Variations
LI Xin, SUN Jin, XIAO Fu, TIAN Jiang-shan
电子学报
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2016, (12): 2960
-2966
.
DOI: 10.3969/j.issn.0372-2112.2016.12.021
