Effect of Annealing Temperature on Performance of ZnO-TFTs Based on Bi1.5Zn1.05Nb1.5O7 Gate Insulator

ZHANG Qi, YE Wei, SUN Fang-li, XIAO Sheng, DU Peng-fei

ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (2) : 455-460.

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ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (2) : 455-460. DOI: 10.12263/DZXB.20210031
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Effect of Annealing Temperature on Performance of ZnO-TFTs Based on Bi1.5Zn1.05Nb1.5O7 Gate Insulator

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(2): 455-460. https://doi.org/10.12263/DZXB.20210031

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