Enhanced Artificial Bee Colony Algorithm to Solve Semiconductor Final Test Scheduling Problem

LÜ Yang, QIAN Bin, HU Rong, ZHANG Zi-qi

ACTA ELECTRONICA SINICA ›› 2021, Vol. 49 ›› Issue (9) : 1708-1715.

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ACTA ELECTRONICA SINICA ›› 2021, Vol. 49 ›› Issue (9) : 1708-1715. DOI: 10.12263/DZXB.20210039
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Enhanced Artificial Bee Colony Algorithm to Solve Semiconductor Final Test Scheduling Problem

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 49(9): 1708-1715. https://doi.org/10.12263/DZXB.20210039

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