Health Status Identification and Fault Time Prediction of MOSFET Device Based on LSTM-DHMM

ZHANG Ming-yu, WANG Qi, YU Yang

Acta Electronica Sinica ›› 2022, Vol. 50 ›› Issue (3) : 643-651.

PDF(2090 KB)
CIE Homepage  |  Join CIE  |  Login CIE  |  中文 
PDF(2090 KB)
Acta Electronica Sinica ›› 2022, Vol. 50 ›› Issue (3) : 643-651. DOI: 10.12263/DZXB.20210047
PAPERS

Health Status Identification and Fault Time Prediction of MOSFET Device Based on LSTM-DHMM

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(3): 643-651 https://doi.org/10.12263/DZXB.20210047

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(2090 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © Acta Electronica Sinica, All Rights Reserved.
Tel: 010-68600735　
E-mail：new@ejournal.org.cn
Powered by Beijing Magtech Co. Ltd,.
Copyright © Acta Electronica Sinica, All Rights Reserved.

/

〈 〉