Health Status Identification and Fault Time Prediction of MOSFET Device Based on LSTM-DHMM

ZHANG Ming-yu, WANG Qi, YU Yang

ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (3) : 643-651.

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ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (3) : 643-651. DOI: 10.12263/DZXB.20210047
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Health Status Identification and Fault Time Prediction of MOSFET Device Based on LSTM-DHMM

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(3): 643-651. https://doi.org/10.12263/DZXB.20210047

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