Hybrid Test Point Set Reduction Method Based on Test Point Quality

OUYANG Dan-tong, XU Bin, DONG Bo-wen, ZHOU Hui-si, ZHANG Li-ming

ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (6) : 1552-1561.

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ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (6) : 1552-1561. DOI: 10.12263/DZXB.20210710
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Hybrid Test Point Set Reduction Method Based on Test Point Quality

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 51(6): 1552-1561. https://doi.org/10.12263/DZXB.20210710

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