Test Case Reuse and Generation Between Similar Programs Based on Function Influence

QIAN Zhong-sheng, SONG Jia, YU Qing-yuan, CHENG Yi-wei, SUN Zhi-wang

ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (7) : 1696-1707.

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ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (7) : 1696-1707. DOI: 10.12263/DZXB.20210953
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Test Case Reuse and Generation Between Similar Programs Based on Function Influence

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(7): 1696-1707. https://doi.org/10.12263/DZXB.20210953

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