UV Detection Performance of ZnO NW Gate GaN HEMT Research

UV Detection Performance of ZnO NW Gate GaN HEMT Research

ZHU Yan-xu, TAN Zhang-yang, WANG Xiao-dong

ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (9) : 2510-2516.

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ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (9) : 2510-2516. DOI: 10.12263/DZXB.20211634

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UV Detection Performance of ZnO NW Gate GaN HEMT Research

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 51(9): 2510-2516. https://doi.org/10.12263/DZXB.20211634

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