The Testing and Repairing Methods for Machine Learning Model Security

ZHANG Xiao-yu, SHEN Chao, LIN Chen-hao, LI Qian, WANG Qian, LI Qi, GUAN Xiao-hong

ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (12) : 2884-2918.

PDF(1166 KB)
CIE Homepage  |  Join CIE  |  Login CIE  |  中文 
PDF(1166 KB)
ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (12) : 2884-2918. DOI: 10.12263/DZXB.20220821
60th Anniversary Special Issue

The Testing and Repairing Methods for Machine Learning Model Security

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(12): 2884-2918. https://doi.org/10.12263/DZXB.20220821

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(1166 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © ACTA ELECTRONICA SINICA, All Rights Reserved.
E-mail：new@ejournal.org.cn
Powered by Beijing Magtech Co. Ltd,.
Copyright © ACTA ELECTRONICA SINICA, All Rights Reserved.

/

〈 〉