Study of Highly Reliable Gate Driver on Array Based on InGaZnO Thin Film Transistor

ZHOU Liu-fei, SHAO Xian-jie, CHEN Xu, WANG Hai-hong, WANG Bao-ping

Acta Electronica Sinica ›› 2022, Vol. 50 ›› Issue (12) : 3014-3020.

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Acta Electronica Sinica ›› 2022, Vol. 50 ›› Issue (12) : 3014-3020. DOI: 10.12263/DZXB.20220916
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Study of Highly Reliable Gate Driver on Array Based on InGaZnO Thin Film Transistor

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(12): 3014-3020 https://doi.org/10.12263/DZXB.20220916

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