An Approach to Multi-Path Coverage Testing Based on Key Edge Probability and Path Layer Proximity

QIAN Zhong-sheng, CHENG Yi-wei, YU Qing-yuan, ZHANG Ding, YAO Chang-sen, QIN Lang-yue

ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (5) : 1341-1349.

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ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (5) : 1341-1349. DOI: 10.12263/DZXB.20220983
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An Approach to Multi-Path Coverage Testing Based on Key Edge Probability and Path Layer Proximity

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 51(5): 1341-1349. https://doi.org/10.12263/DZXB.20220983

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