Construction of Fault Injection Attacks Resistant S-Boxes

CHAI Jin-jin, WU Xuan

ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (12) : 3422-3430.

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ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (12) : 3422-3430. DOI: 10.12263/DZXB.20221111
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Construction of Fault Injection Attacks Resistant S-Boxes

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 51(12): 3422-3430. https://doi.org/10.12263/DZXB.20221111

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