Automatic Test Pattern Solving with Fault Property Prediction

Automatic Test Pattern Solving with Fault Property Prediction

HE Li-yuan, HUANG Jun-hua, TAO Ji-ping

ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (12) : 3540-3548.

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ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (12) : 3540-3548. DOI: 10.12263/DZXB.20221121

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Automatic Test Pattern Solving with Fault Property Prediction

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 51(12): 3540-3548. https://doi.org/10.12263/DZXB.20221121

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