Package Test and Output Characteristics of GaN-Based Hetero Junction Structure Hall Sensors

MA Kai-ming, DAI Jian-xun, ZHANG Hui, DING Nan-nan, SUN Nan, SUN Zhong-hao, LIU Yan-hong, C LIANG Yung, HUANG Huo-lin

Acta Electronica Sinica ›› 2024

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Acta Electronica Sinica ›› 2024 DOI: 10.12263/DZXB.20230262

Package Test and Output Characteristics of GaN-Based Hetero Junction Structure Hall Sensors

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024 https://doi.org/10.12263/DZXB.20230262

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