Highly Reliable Gate Driver on Array Circuit Using Time-Division Driving Method Base on IGZO Thin Film Transistor

ZHOU Liu-fei, SHAO Xian-jie, WANG Hai-hong, WANG Bao-ping

ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (12) : 3463-3472.

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ACTA ELECTRONICA SINICA ›› 2023, Vol. 51 ›› Issue (12) : 3463-3472. DOI: 10.12263/DZXB.20230367
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Highly Reliable Gate Driver on Array Circuit Using Time-Division Driving Method Base on IGZO Thin Film Transistor

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 51(12): 3463-3472. https://doi.org/10.12263/DZXB.20230367

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