Probability Imaging for Defects Using Predicted Lamb Wave Reference Signal

Probability Imaging for Defects Using Predicted Lamb Wave Reference Signal

CHEN Xiao, DAI Jie

ACTA ELECTRONICA SINICA ›› 2024, Vol. 52 ›› Issue (9) : 3262-3271.

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ACTA ELECTRONICA SINICA ›› 2024, Vol. 52 ›› Issue (9) : 3262-3271. DOI: 10.12263/DZXB.20230878

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Probability Imaging for Defects Using Predicted Lamb Wave Reference Signal

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 52(9): 3262-3271. https://doi.org/10.12263/DZXB.20230878

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