Mutation Testing Based on Comparison of Paths

Mutation Testing Based on Comparison of Paths

YAO Xiang-juan;;GONG Dun-wei;

ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (1) : 103-107.

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ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (1) : 103-107. DOI: 10.3969/j.issn.0372-2112.2012.01.017

Mutation Testing Based on Comparison of Paths

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2012, 40(1): 103-107. https://doi.org/10.3969/j.issn.0372-2112.2012.01.017

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