The Estimation of Fault Probability of Elementary Gates Based on the Layout Structure Information

XIAO Jie;JIANG Jian-hui

ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (2) : 235-240.

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ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (2) : 235-240. DOI: 10.3969/j.issn.0372-2112.2012.02.005
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The Estimation of Fault Probability of Elementary Gates Based on the Layout Structure Information

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2012, 40(2): 235-240. https://doi.org/10.3969/j.issn.0372-2112.2012.02.005

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