Test Data Compression for Multiple Scan Chains with Dynamic Vector Adjustment

LIU Jie;LIANG Hua-guo;YI Mao-xiang;ZHAO Fa-yong

ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (2) : 287-292.

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ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (2) : 287-292. DOI: 10.3969/j.issn.0372-2112.2012.02.013
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Test Data Compression for Multiple Scan Chains with Dynamic Vector Adjustment

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2012, 40(2): 287-292. https://doi.org/10.3969/j.issn.0372-2112.2012.02.013

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