A Relation Model Between Integrated Circuit Yield and Reliability Based on the Defect&rsquo;s Uniform Distribution

doi:10.3969/j.issn.0372-2112.2012.08.027

A Relation Model Between Integrated Circuit Yield and Reliability Based on the Defect’s Uniform Distribution

ZHAO Tian-xu, DUAN Xu-chao

ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (8) : 1665-1669.

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ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (8) : 1665-1669. DOI: 10.3969/j.issn.0372-2112.2012.08.027

A Relation Model Between Integrated Circuit Yield and Reliability Based on the Defect’s Uniform Distribution

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2012, 40(8): 1665-1669. https://doi.org/10.3969/j.issn.0372-2112.2012.08.027

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Received	Revised	Published
2011-09-06	2011-12-09	2012-08-25
Just Accepted Date	Issue Date
2023-01-18	2012-08-25

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