The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head

XIAO Xiang-hui, PENG Min-fang, LI Fu-hai, ZHAN Jie, TANG Rong-jun

ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (10) : 2140-2144.

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ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (10) : 2140-2144. DOI: 10.3969/j.issn.0372-2112.2012.10.040

The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2012, 40(10): 2140-2144. https://doi.org/10.3969/j.issn.0372-2112.2012.10.040

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