An On-Chip Circuit for Monitoring Failure Due to TDDB

XIN Wei-ping, ZHUANG Yi-qi, LI Xiao-ming

ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (11) : 2188-2193.

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ACTA ELECTRONICA SINICA ›› 2012, Vol. 40 ›› Issue (11) : 2188-2193. DOI: 10.3969/j.issn.0372-2112.2012.11.008

An On-Chip Circuit for Monitoring Failure Due to TDDB

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2012, 40(11): 2188-2193. https://doi.org/10.3969/j.issn.0372-2112.2012.11.008

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