Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

OUYANG Cheng-tian, JIANG Jian-hui

ACTA ELECTRONICA SINICA ›› 2013, Vol. 41 ›› Issue (1) : 171-177.

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ACTA ELECTRONICA SINICA ›› 2013, Vol. 41 ›› Issue (1) : 171-177. DOI: 10.3969/j.issn.0372-2112.2013.01.30

Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 41(1): 171-177. https://doi.org/10.3969/j.issn.0372-2112.2013.01.30

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