Screening Test Design for Electronics Based on Performance Degradation

ZHONG Qiang-hui, ZHANG Zhi-hua, LI Da-wei

ACTA ELECTRONICA SINICA ›› 2013, Vol. 41 ›› Issue (9) : 1788-1793.

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ACTA ELECTRONICA SINICA ›› 2013, Vol. 41 ›› Issue (9) : 1788-1793. DOI: 10.3969/j.issn.0372-2112.2013.09.019

Screening Test Design for Electronics Based on Performance Degradation

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 41(9): 1788-1793. https://doi.org/10.3969/j.issn.0372-2112.2013.09.019

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