HV-EL Drivers ICs on Novel HV-BCD Process Platform with Self-Extracted JTE Trench Termination

HUANG Wei, HU Nan-zhong, LI Hai-ou, YU Zong-guang

ACTA ELECTRONICA SINICA ›› 2013, Vol. 41 ›› Issue (9) : 1858-1862.

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ACTA ELECTRONICA SINICA ›› 2013, Vol. 41 ›› Issue (9) : 1858-1862. DOI: 10.3969/j.issn.0372-2112.2013.09.31

HV-EL Drivers ICs on Novel HV-BCD Process Platform with Self-Extracted JTE Trench Termination

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 41(9): 1858-1862. https://doi.org/10.3969/j.issn.0372-2112.2013.09.31

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