A Defect Analysis-Oriented Relation Model of Circuit Yield and Reliability
XIAO Jie, JIANG Jian-hui, YANG Xu-hua, LIANG Jia-rong
Acta Electronica Sinica ›› 2014, Vol. 42 ›› Issue (4) : 747-755.
A Defect Analysis-Oriented Relation Model of Circuit Yield and Reliability
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