Test Case Generation Based on Orthogonal Exploration and Particle Swarm Optimization

WANG Ling-sai, JIANG Shu-juan, ZHANG Yan-mei, YU Qiao

ACTA ELECTRONICA SINICA ›› 2014, Vol. 42 ›› Issue (12) : 2345-2351.

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ACTA ELECTRONICA SINICA ›› 2014, Vol. 42 ›› Issue (12) : 2345-2351. DOI: 10.3969/j.issn.0372-2112.2014.12.002

Test Case Generation Based on Orthogonal Exploration and Particle Swarm Optimization

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2014, 42(12): 2345-2351. https://doi.org/10.3969/j.issn.0372-2112.2014.12.002

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