Design of Highly Robust PUF Based on the Optimal Gate Voltage

WANG Peng-jun, ZHANG Xue-long, ZHANG Yue-jun

ACTA ELECTRONICA SINICA ›› 2015, Vol. 43 ›› Issue (5) : 907-910.

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ACTA ELECTRONICA SINICA ›› 2015, Vol. 43 ›› Issue (5) : 907-910. DOI: 10.3969/j.issn.0372-2112.2015.05.011

Design of Highly Robust PUF Based on the Optimal Gate Voltage

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2015, 43(5): 907-910. https://doi.org/10.3969/j.issn.0372-2112.2015.05.011

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