Reliability Calculation Method of Logical Circuit Based on Bernoulli Distribution

CAI Shuo, KUANG Ji-shun, LIU Tie-qiao, LING Chun-qing, YOU Zhi-qiang

ACTA ELECTRONICA SINICA ›› 2015, Vol. 43 ›› Issue (11) : 2292-2297.

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ACTA ELECTRONICA SINICA ›› 2015, Vol. 43 ›› Issue (11) : 2292-2297. DOI: 10.3969/j.issn.0372-2112.2015.11.023

Reliability Calculation Method of Logical Circuit Based on Bernoulli Distribution

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2015, 43(11): 2292-2297. https://doi.org/10.3969/j.issn.0372-2112.2015.11.023

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