Review on Early Effect Model of Si and SiGe Transistors and Applications to Circuit Simulators

XU Xiao-bo, ZHANG Lin, WANG Xiao-yan, GU Wen-ping, HU Hui-yong, GE Jian-hua

ACTA ELECTRONICA SINICA ›› 2016, Vol. 44 ›› Issue (7) : 1763-1771.

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ACTA ELECTRONICA SINICA ›› 2016, Vol. 44 ›› Issue (7) : 1763-1771. DOI: 10.3969/j.issn.0372-2112.2016.07.035

Review on Early Effect Model of Si and SiGe Transistors and Applications to Circuit Simulators

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2016, 44(7): 1763-1771. https://doi.org/10.3969/j.issn.0372-2112.2016.07.035

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