Investigation on Low-Frequency Noise Models and Representation for Reliability of CMOS Inverter

CHEN Xiao-juan, CHEN Dong-yang, WU Jie

ACTA ELECTRONICA SINICA ›› 2016, Vol. 44 ›› Issue (11) : 2646-2652.

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ACTA ELECTRONICA SINICA ›› 2016, Vol. 44 ›› Issue (11) : 2646-2652. DOI: 10.3969/j.issn.0372-2112.2016.11.012

Investigation on Low-Frequency Noise Models and Representation for Reliability of CMOS Inverter

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2016, 44(11): 2646-2652. https://doi.org/10.3969/j.issn.0372-2112.2016.11.012

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