EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks

LIU Yu, HAN Feng, LU Xi-cheng, WANG Jian-guo

ACTA ELECTRONICA SINICA ›› 2016, Vol. 44 ›› Issue (11) : 2695-2703.

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ACTA ELECTRONICA SINICA ›› 2016, Vol. 44 ›› Issue (11) : 2695-2703. DOI: 10.3969/j.issn.0372-2112.2016.11.019

EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2016, 44(11): 2695-2703. https://doi.org/10.3969/j.issn.0372-2112.2016.11.019

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