Research on Combined Intelligent Fault Diagnostic Method Based on CELCD and MFVPMCD

PAN Hai-yang, ZHENG Jin-de, YANG Yu, TONG Bao-hong

ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (3) : 546-551.

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ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (3) : 546-551. DOI: 10.3969/j.issn.0372-2112.2017.03.006

Research on Combined Intelligent Fault Diagnostic Method Based on CELCD and MFVPMCD

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 45(3): 546-551. https://doi.org/10.3969/j.issn.0372-2112.2017.03.006

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