Topography and Volume Measurement Method Based on Large-scale Scanning Ion Conductance Microscopy

GUO Ren-fei, ZHUANG Jian, YU De-hong

ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (5) : 1072-1077.

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ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (5) : 1072-1077. DOI: 10.3969/j.issn.0372-2112.2017.05.007

Topography and Volume Measurement Method Based on Large-scale Scanning Ion Conductance Microscopy

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 45(5): 1072-1077. https://doi.org/10.3969/j.issn.0372-2112.2017.05.007

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