Low Power Multistage Test Data Compression Scheme

CHEN Tian, YI Xin, WANG Wei, LIU Jun, LIANG Hua-guo, REN Fu-ji

ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (6) : 1382-1388.

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ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (6) : 1382-1388. DOI: 10.3969/j.issn.0372-2112.2017.06.015

Low Power Multistage Test Data Compression Scheme

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 45(6): 1382-1388. https://doi.org/10.3969/j.issn.0372-2112.2017.06.015

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