Reflection Symmetry Axis Detection Based on Improved Mean-Standard Deviation Curve Descriptor

LIU Hong-min, XIONG Wen-jun, ZHAO Wei, WANG Zhi-heng, WANG Jing

ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (7) : 1701-1706.

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ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (7) : 1701-1706. DOI: 10.3969/j.issn.0372-2112.2017.07.021

Reflection Symmetry Axis Detection Based on Improved Mean-Standard Deviation Curve Descriptor

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 45(7): 1701-1706. https://doi.org/10.3969/j.issn.0372-2112.2017.07.021

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