Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance
ZHENG Jian-fei, HU Chang-hua, SI Xiao-sheng, LIN Bin
Acta Electronica Sinica ›› 2017, Vol. 45 ›› Issue (7) : 1740-1749.
Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance
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