A Method for Finding Redundant Mutants in Mutation Testing

QIAN Gen-nan, WANG Ya-wen, GONG Yun-zhan, MENG Fan-rong

ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (8) : 1970-1975.

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ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (8) : 1970-1975. DOI: 10.3969/j.issn.0372-2112.2017.08.023

A Method for Finding Redundant Mutants in Mutation Testing

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 45(8): 1970-1975. https://doi.org/10.3969/j.issn.0372-2112.2017.08.023

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