An Efficient Estimation Method for Chip-Level Parametric Yield Based on Elastic Net Sparse Representation

LI Xin, SUN Jin, XIAO Fu

ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (12) : 2917-2924.

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ACTA ELECTRONICA SINICA ›› 2017, Vol. 45 ›› Issue (12) : 2917-2924. DOI: 10.3969/j.issn.0372-2112.2017.12.013

An Efficient Estimation Method for Chip-Level Parametric Yield Based on Elastic Net Sparse Representation

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 45(12): 2917-2924. https://doi.org/10.3969/j.issn.0372-2112.2017.12.013

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