Yield Optimization Technique for Three Dimensional Memory Based on Redundancy Sharing Among Adjacent Layers

LIU Jun, ZHU Cheng-qiang, WU Xi, WANG Wei, REN Fu-ji

ACTA ELECTRONICA SINICA ›› 2018, Vol. 46 ›› Issue (3) : 629-635.

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ACTA ELECTRONICA SINICA ›› 2018, Vol. 46 ›› Issue (3) : 629-635. DOI: 10.3969/j.issn.0372-2112.2018.03.017

Yield Optimization Technique for Three Dimensional Memory Based on Redundancy Sharing Among Adjacent Layers

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 46(3): 629-635. https://doi.org/10.3969/j.issn.0372-2112.2018.03.017

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