Simulation of Parasitic Bipolar Transistor Effect in Nanometric SRAM

ZHAO Wen, GUO Xiao-qiang, CHEN Wei, LUO Yin-hong, WANG Han-ning

ACTA ELECTRONICA SINICA ›› 2018, Vol. 46 ›› Issue (10) : 2495-2503.

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ACTA ELECTRONICA SINICA ›› 2018, Vol. 46 ›› Issue (10) : 2495-2503. DOI: 10.3969/j.issn.0372-2112.2018.10.025

Simulation of Parasitic Bipolar Transistor Effect in Nanometric SRAM

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 46(10): 2495-2503. https://doi.org/10.3969/j.issn.0372-2112.2018.10.025

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