Study of Measurement of the Ion Effective LET in Semiconductor Devices

SHI Shu-ting, GUO Gang, LIU Jian-cheng, CAI Li, CHEN Quan, SHEN Dong-jun, HUI Ning, ZHANG Yan-wen, QIN Ying-can, HAN Jin-hua, CHEN Qi-ming, ZHANG Fu-qiang, YIN Qian, XIAO Shu-yan

Acta Electronica Sinica ›› 2018, Vol. 46 ›› Issue (10) : 2546-2550.

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Acta Electronica Sinica ›› 2018, Vol. 46 ›› Issue (10) : 2546-2550. DOI: 10.3969/j.issn.0372-2112.2018.10.032

Study of Measurement of the Ion Effective LET in Semiconductor Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 46(10): 2546-2550 https://doi.org/10.3969/j.issn.0372-2112.2018.10.032

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